|A Methodological Roadmap for Reliability|
Brookhaven National Laboratory, Upton, NY, United States
Starting from the consideration that different issues affecting the reliability and degradation of PV modules and cells still require further investigation for a solution, this paper outlines a methodological approach, with emphasis on the consideration that PV devices are complex systems of systems. Recalling methodological discussions both in system engineering and in risk analysis, the proposed approach emphasizes the importance to study such complex systems adopting a holistic approach, thus taking into consideration interactions between system components as well as between the system and the surrounding environment. The work addresses the status of the reliability investigation for c-Si and CIGS modules, and refers to the ongoing debate pointing at the need for normative implementation for reliability issues. Guided by a causal/effect chain to module failure, the work also considers the development of a set of indicators to characterize reliability. They are expected to provide guidance for detailed investigations and to frame a future reliability and degradation mapping approach.