|Study of wavelength-resolved light-induced metastable defects in (Ag,Cu)(In,Ga)Se2 thin-films using capacitance methods|
|Abhinav Chikhalkar1, Michael Goryll1, William Shafarman2, Richard King1
1Arizona State University, Tempe, AZ, United States
/2University of Delaware, Newark, DE, United States
Metastable defects created in silver alloys of copper indium gallium diselenide (ACIGS) are studied using admittance spectroscopy and drive level capacitance profiling (DLCP). Admittance spectroscopy is used to extract the activation energy of the defects and DLCP is used to extract the free-carrier concentration, defect density and spatial distribution of these defects. The structure and chemistry of the metastable defects formed due to exposure to AM1.5G light is probed further. The energy of formation of these defects is extracted by measuring the evolution of defect density due to exposure to photons with varying energies.