|Nanoprobe Enabled Electron Beam Induced Current Measurements on III-V Nanowire Based Solar Cells|
|Enrique Barrigón1, Gaute Otnes1,2, Yuwei Zhang1, Lukas Hrachowina1, Xulu Zeng1, Yang Chen1, Lars Samuelson1, Magnus Borgström1
1Division of Solid State Physics and NanoLund, Lund, Sweden
/2Institute for Energy Technology, Kjeller, Norway
Electron beam induced current (EBIC) is a well-established tool to, among others, locate and analyze p-n junctions, Schottky contacts or heterostructures in planar devices and is now becoming essential to study and optimize devices at the nanoscale, like III-V nanowire (NW) based solar cells. Here, we report on EBIC measurements on III-V single NW solar cells as well as on fully processed NW devices. This paper also highlights the importance of EBIC to optimize short circuit current density values of fully processed nanowire solar cells of 1 mm2.
Area: Sub-Area 5.5: Advanced Characterization of Photovoltaic Devices