|Predicting Photovoltaic Module Series Resistance based on Indoor-Aging Tests & Thermal Cycling Cumulative Exposure Estimates|
|C. Birk Jones1, Thushara Gunda1, Hamzavy Babak2, William B. Hobbs3, Cara Libby4
1Sandia National Labs, Albuquerque, NM, United States
/2Southern Research, Birmingham, AL, United States
/3Southern Company, Birmingham, AL, United States
/4Electric Power Research Institute, Palo Alto, CA, United States
IEC 61215 and Qualification Plus indoor aging tests have been recognized as valuable assessment procedures for identifying photovoltaic modules that are prone to early-life failures or excessive degradation. However, it is unclear how well they match with reality, and if they can be used to predict in-field performance. The present work performed indoor aging thermal cycling tests on identical modules installed in the field, computed the overall exposure to thermal cycling, and used the indoor results to predict the outdoor series resistance of like modules operational in the field for over five years.
Area: Sub-Area 9.2: Device Reliability and Accelerated Testing